The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Jan. 03, 2024
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Vladimir Zhernakov, Tyumen, RU;

Xiaotong Suo, Stanford, CA (US);

Jose Celaya Galvan, Menlo Park, CA (US);

Velizar Vesselinov, Sugar Land, TX (US);

Neil Holger White Eklund, Oakland, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 47/022 (2012.01); E21B 44/00 (2006.01); E21B 49/00 (2006.01); G01V 20/00 (2024.01); E21B 41/00 (2006.01);
U.S. Cl.
CPC ...
E21B 47/022 (2013.01); E21B 44/00 (2013.01); G01V 20/00 (2024.01); E21B 41/00 (2013.01); E21B 49/00 (2013.01);
Abstract

A system and method that include receiving offset well data collected from an offset well, wherein the offset well data comprises data representing a trajectory of an offset. The system and method also include receiving subject well data comprising a trajectory of at least a portion of a subject. The system and method additionally include determining a similarity value between the trajectory of the offset well and the subject well. The system and method also include selecting at least one offset well for offset well analysis based on the similarity value. The system and method further include adjusting at least one parameter of the subject well based on the offset well analysis.


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