The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Feb. 14, 2024
Applicant:

Subaru Corporation, Tokyo, JP;

Inventors:

Yoichi Sato, Tokyo, JP;

Kazuma Ashizawa, Tokyo, JP;

Yutaka Yamagishi, Tokyo, JP;

Assignee:

SUBARU CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B64F 5/10 (2017.01); B64F 5/60 (2017.01);
U.S. Cl.
CPC ...
B64F 5/10 (2017.01); B64F 5/60 (2017.01); G05B 2219/35017 (2013.01);
Abstract

A method of producing a structure including a first component, having a first surface, and a second component, having second and third surfaces includes: measuring profiles of the second and third surfaces; measuring profiles of fourth and fifth surfaces of subcomponents; assembling the first component by coupling the subcomponents with adjustment; recording data representing the adjustment; estimating a changed profile of the second surface in case of coupling the third surface to the first surface; determining a coupling position of the third surface to the first surface; and coupling the third surface to the first surface at the determined coupling position. The predetermined contour degree is required for the second surface. The first surface is formed by the fourth surfaces. The fifth surfaces influence a profile of the first surface. The changed profile is estimated based on the profiles of the second to fifth surfaces and the recorded data.


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