The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Apr. 21, 2022
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

David Nister, Bellevue, WA (US);

Cheng-Chieh Yang, Sunnyvale, CA (US);

Yue Wu, Mountain View, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60W 50/02 (2012.01); B60W 60/00 (2020.01);
U.S. Cl.
CPC ...
B60W 50/0205 (2013.01); B60W 60/001 (2020.02); B60W 2050/021 (2013.01); B60W 2420/403 (2013.01); B60W 2554/404 (2020.02);
Abstract

In various examples, an end-to-end perception evaluation system for autonomous and semi-autonomous machine applications may be implemented to evaluate how the accuracy or precision of outputs of machine learning models—such as deep neural networks (DNNs)—impact downstream performance of the machine when relied upon. For example, decisions computed by the system using ground truth output types may be compared to decisions computed by the system using the perception outputs. As a result, discrepancies in downstream decision making of the system between the ground truth information and the perception information may be evaluated to either aid in updating or retraining of the machine learning model or aid in generating more accurate or precise ground truth information.


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