The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
May. 04, 2021
Inkbit, Llc, Medford, MA (US);
Wojciech Matusik, Lexington, MA (US);
Gregory Ellson, Cambridge, MA (US);
Desai Chen, Arlington, MA (US);
Javier Ramos, Boston, MA (US);
Davide Marini, Medford, MA (US);
Aaron Weber, Arlington, MA (US);
Inkbit, LLC, Medford, MA (US);
Abstract
An approach to improving optical scanning increases the strength of optical reflection from the build material during fabrication. In some examples, the approach makes use of an additive (or a combination of multiple additives) that increases the received signal strength and/or improves the received signal-to-noise ratio in optical scanning for industrial metrology. Elements not naturally present in the material are introduced in the additives in order to increase fluorescence, scattering or luminescence. Such additives may include one or more of: small molecules, polymers, peptides, proteins, metal or semiconductive nanoparticles, and silicate nanoparticles.