The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Mar. 08, 2022
Applicant:

Hypertherm, Inc., Hanover, NH (US);

Inventors:

Garen Cakmak, Montreal, CA;

Daniel Marcovici, Sao Paulo, BR;

Jacques Barbe, Montreal, CA;

Emile Bouthillier, Montreal, CA;

Assignee:

Hypertherm, Inc., Hanover, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/00 (2006.01); B23K 10/00 (2006.01); B23K 37/02 (2006.01); B25J 9/16 (2006.01); B25J 15/00 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1664 (2013.01); B23K 10/00 (2013.01); B23K 37/0229 (2013.01); B25J 9/1661 (2013.01); B25J 9/1671 (2013.01); B25J 15/0019 (2013.01); G05B 2219/35012 (2013.01); G05B 2219/39001 (2013.01);
Abstract

The present invention features a computer-implemented method of planning a processing path relative to a three-dimensional workpiece for a plasma arc cutting system coupled to a robotic arm. The method includes receiving input data from a user comprising (i) Computer-Aided Design (CAD) data for specifying a desired part to be processed from the three-dimensional workpiece, and (ii) one or more desired parameters for operating the plasma arc cutting system. A plurality of features of the desired part to be formed on the three-dimensional workpiece are identified based on the CAD data. The method also includes dynamically filtering a library of cut charts based on the plurality of features and the desired operating parameters to determine a recommended cut chart for processing the plurality of features. The method further includes generating the processing path based on the recommended cut chart and the plurality of features to be formed.


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