The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Jul. 16, 2021
Applicant:

Eyeque Inc., Newark, CA (US);

Inventors:

Noam Sapiens, Newark, CA (US);

John Serri, Newark, CA (US);

Assignee:

EyeQue Inc., Newark, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/103 (2006.01); A61B 3/135 (2006.01);
U.S. Cl.
CPC ...
A61B 3/103 (2013.01); A61B 3/135 (2013.01);
Abstract

In an embodiment, multiple conjugate planes are used to create a plurality of optical pupil planes and a plurality of image planes. These optical planes solve multiple problems and introduce significant performance enhancements in the system. In one implementation of a disclosed embodiment, the measurement channel is based on the reverse Shack-Hartmann principle. By introducing a relay system (for example a 4-f lens system) the slit plane could be made conjugate to the measured system pupil plane (unlike a previous implementation where the slits were places away from the pupil plane as it was not accessible directly). Creating a virtual pupil plane allows for more accurate placement of the plane without the need for contact with the measured optical system.


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