The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Nov. 30, 2023
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Kanagawa-ken, JP;

Inventors:

Shunpei Yamazaki, Tokyo, JP;

Shingo Eguchi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10K 50/844 (2023.01); H10K 50/84 (2023.01); H10K 50/842 (2023.01); H10K 59/12 (2023.01); H10K 59/124 (2023.01); H10K 59/131 (2023.01); H10K 59/38 (2023.01); H10K 50/86 (2023.01); H10K 77/10 (2023.01); H10K 102/00 (2023.01);
U.S. Cl.
CPC ...
H10K 50/8445 (2023.02); H10K 50/84 (2023.02); H10K 50/8426 (2023.02); H10K 50/844 (2023.02); H10K 59/12 (2023.02); H10K 59/124 (2023.02); H10K 59/131 (2023.02); H10K 59/38 (2023.02); H10K 50/865 (2023.02); H10K 77/111 (2023.02); H10K 2102/311 (2023.02); H10K 2102/351 (2023.02);
Abstract

A highly reliable light-emitting device is provided. Damage to an element due to externally applied physical power is suppressed. Alternatively, in a process of pressure-bonding of an FPC, damage to a resin and a wiring which are in contact with a flexible substrate due to heat is suppressed. A neutral plane at which stress-strain is not generated when a flexible light-emitting device including an organic EL element is deformed, is positioned in the vicinity of a transistor and the organic EL element. Alternatively, the hardness of the outermost surface of a light-emitting device is high. Alternatively, a substrate having a coefficient of thermal expansion of 10 ppm/K or lower is used as a substrate that overlaps with a terminal portion connected to an FPC.


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