The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Aug. 08, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Abhishek Kumar Singh, Bangalore, IN;

Anil Agiwal, Bangalore, IN;

Pravjyot Singh Deogun, Bangalore, IN;

Anshuman Nigam, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 74/0833 (2024.01); H04L 5/00 (2006.01); H04W 16/14 (2009.01); H04W 24/08 (2009.01); H04W 48/16 (2009.01); H04W 74/0808 (2024.01);
U.S. Cl.
CPC ...
H04W 74/0833 (2013.01); H04L 5/0048 (2013.01); H04W 16/14 (2013.01); H04W 24/08 (2013.01); H04W 74/0808 (2013.01);
Abstract

The present disclosure relates to a communication method and system for converging a 5th-Generation (5G) communication system for supporting higher data rates beyond a 4th-Generation (4G) system with a technology for Internet of Things (IoT). The present disclosure may be applied to intelligent services based on the 5G communication technology and the IoT-related technology, such as smart home, smart building, smart city, smart car, connected car, health care, digital education, smart retail, security and safety services. Embodiments herein disclose a method for performing random access channel procedure by a UE (). The method includes determining a first measurement metric value and a second measurement metric value for one of a plurality of SSBs and a plurality of CSI-RSs. The method includes selecting one of a first set of SSBs and a first set of CSI-RSs from one of the plurality of SSBs and the plurality of CSI-RSs based on the first measurement metric. The method selects a second set of SSBs and a second set of CSI-RSs from one of the first set of SSBs and the first set of CSI-RSs based on the second measurement metric and determines a selection criteria and selects one of at least one candidate SSBs and at least one candidate CSI-RS from one of the second set of SSBs and the second set of CSI-RSs based on the selection criteria.


Find Patent Forward Citations

Loading…