The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Aug. 01, 2024
Zhejiang Hehu Technology Co., Ltd., Hangzhou, CN;
Zhejiang Hehu Technology Co., Ltd., Hangzhou, CN;
Abstract
The present invention relates to the technical field of optical imaging, in particular to an optical field imaging system based on dual galvanometer scanning, comprising: an imaging unit, a galvanometer unit, a microlens array, a relay system and a camera which are arranged successively along a transmission direction of an optical path. The imaging unit is used for optically imaging a sample or a scenario. The galvanometer unit is composed of two non-parallel two-dimensional galvanometers which deflect beams in two directions of X axis and Y axis respectively, so that an input beam is perpendicular to an output beam. After the beam outputted by the galvanometer unit passes through the microlens array and the relay system, the beam is collected by the camera to obtain the stack information of optical field images.