The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Nov. 14, 2022
Applicant:

Rakuten Symphony, Inc., Tokyo, JP;

Inventors:

Kiran Kumar Pusarla, Bangalore, IN;

Venkatesh Muralidhara, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/21 (2023.01); H04L 27/26 (2006.01); H04L 27/34 (2006.01);
U.S. Cl.
CPC ...
H04L 27/26526 (2021.01); H04L 27/34 (2013.01); H04W 72/21 (2023.01);
Abstract

Techniques for receiving a PUSCH and a PUCCH transmitted by a high speed transmitter are provided including calculating a phase difference of OFDM symbols of the PUCCH from: OFDM symbols of a first and second DM-RS, OFDM symbols of the second and third DM-RS, and OFDM symbols of the first and third DM-RS. Correlating the OFDM symbols across all the DM-RS. Determining a doppler shift which is reported to Layer 2. Compensating channel estimates and data symbols with the doppler shift. Performing a first level of phase correction on the PUSCH by correcting the phase on output samples of an IDFT from the doppler shift received from Layer 2. Measuring a phase deviation on the output of the first level of phase correction, and accumulating the measured phase deviation and the received doppler shift. Reporting the accumulated phase correction to Layer 2, and performing a second level of phase correction.


Find Patent Forward Citations

Loading…