The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Nov. 08, 2022
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Min-Hyung Cho, Daejeon, KR;

Young-Deuk Jeon, Sejong-si, KR;

Jin Ho Han, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/4099 (2006.01); G11C 5/04 (2006.01); G11C 5/06 (2006.01);
U.S. Cl.
CPC ...
G11C 11/4099 (2013.01); G11C 5/04 (2013.01); G11C 5/063 (2013.01);
Abstract

A method for ZQ calibration for a data transmission driving circuit of each memory die in a memory chip package in which memory dies are stacked, includes generating a reference current through a reference resistor connected between a power terminal supplying a power voltage of the data transmission driving circuit and a ground terminal and a first transistor that is diode-connected; supplying first currents corresponding to the reference currents to a pull-up driver of each memory die; performing ZQ calibration of a pull-up driver of a corresponding memory die by comparing a first voltage formed by each first current with a reference voltage formed by the reference current in each of the plurality of memory dies; and performing ZQ calibration of a pull-down driver of the corresponding memory die based on an output impedance of the ZQ calibrated pull-up driver in each of the memory dies.


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