The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Oct. 20, 2023
Lunit Inc., Seoul, KR;
Biagio Brattoli, Seoul, KR;
Chan-Young Ock, Seoul, KR;
Wonkyung Jung, Seoul, KR;
Soo Ick Cho, Seoul, KR;
Kyunghyun Paeng, Seoul, KR;
Dong Geun Yoo, Seoul, KR;
Lunit Inc., Seoul, KR;
Abstract
Provided is a method for analysing a pathology image, which is performed by at least one processor and includes acquiring a pathology image, inputting the acquired pathology image into a machine learning model and acquiring an analysis result for the pathology image from the machine learning model, and outputting the acquired analysis result, in which the machine learning model is a model trained by using a training data set generated based on a first pathology data set associated with a first domain and a second pathology data set associated with a second domain different from the first domain.