The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Jan. 26, 2021
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Fumio Hashimoto, Hamamatsu, JP;

Masanori Ito, Hamamatsu, JP;

Kibo Ote, Hamamatsu, JP;

Takashi Isobe, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/25 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06V 10/25 (2022.01); G06V 10/82 (2022.01); G06T 2207/10081 (2013.01); G06T 2207/10104 (2013.01);
Abstract

A radiation tomography system includes a radiation tomography apparatus and an image processing apparatus. The image processing apparatus includes an image reconstruction unit, an attenuation distribution image creation unit, and an attenuation correction unit. The attenuation distribution image creation unit includes a first processing unit and a second processing unit. The first processing unit creates and outputs an intermediate image based on an emission scan image using a trained neural network. The second processing unit creates and outputs an attenuation distribution image based on the intermediate image.


Find Patent Forward Citations

Hashimoto, Fumio. (2025). Attenuation distribution image creating device, image processing device, radiation computed tomography system, attenuation distribution image creating method, and image processing method (U.S. Patent No. 12266102). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12266102

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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