The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Feb. 22, 2022
Siemens Healthcare Gmbh, Erlangen, DE;
Bernhard Schmidt, Fuerth, DE;
Thomas Allmendinger, Forchheim, DE;
SIEMENS HEALTHINEERS AG, Forchheim, DE;
Abstract
An imaging method is described for generating image data of an examination region of an object that is to be examined. First X-ray projection measurement data of the examination region is acquired using a first X-ray energy spectrum and at least second X-ray projection measurement data of the examination region is acquired using a second X-ray energy spectrum which is different from the first X-ray energy spectrum. A priori image data is reconstructed based on at least the first X-ray projection measurement data and a location-dependent distribution of X-ray attenuation values. A basis material decomposition is performed based on the first X-ray projection measurement data and the at least second X-ray projection measurement data. A location-dependent weighting of the basis materials is determined as a function of the location-dependent distribution of the X-ray attenuation values. An image for the examination region is determined by reconstructing virtual basis-material-weighted image data.