The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Oct. 10, 2022
The Boeing Company, Chicago, IL (US);
Dominic N. Nwoke, Spanaway, WA (US);
Robert W. Grube, Edmonds, WA (US);
Scott H. Fife, Roy, WA (US);
Christopher H. Rees, Seattle, WA (US);
The Boeing Company, Arlington, VA (US);
Abstract
A method for detecting defects includes steps of: (1) calculating an average value for intensity of CT image voxels in a neighborhood; (2) calculating a difference value for the intensity of the voxels in the neighborhood; (3) calculating a standard deviation for the intensity of the voxels in the neighborhood; (4) calculating a z-score for each one of the voxels; (5) identifying a cluster of neighboring ones of the voxels; (6) determining a cluster-boundary parameter of the cluster; and (7) classifying the cluster as a defect when the cluster-boundary parameter of the cluster is above a parameter threshold.