The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Oct. 28, 2022
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Jialiang Mao, Mountain View, CA (US);

Rina Siller Friedberg, San Francisco, CA (US);

Karthik Rajkumar, Palo Alto, CA (US);

Qian Yao, Sunnyvale, CA (US);

Min Liu, Palo Alto, CA (US);

YinYin Yu, Mountain View, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/0241 (2023.01); G06Q 30/0242 (2023.01);
U.S. Cl.
CPC ...
G06Q 30/0243 (2013.01); G06Q 30/0277 (2013.01);
Abstract

Methods, systems, and computer programs are presented for eliminating bias while training an ML model using training data that includes past experimental data. One method includes accessing experiment results, for A/B testing of a first model, that comprise information regarding engagement with a first set of items presented to users, each item being presented within an ordered list of results. A position bias is calculated for positions within the ordered list of results where the items were presented. A machine-learning program is trained to obtain a second model using a training set comprising values for features that include the calculated position bias. The method includes detecting a second set of items to be ranked for presentation to a first user, and calculates, using the second model, a relevance score for the second set of items, which are ranked based on the respective relevance score and presented on a display.


Find Patent Forward Citations

Mao, Jialiang. (2025). Position-bias correction for predictive and ranking systems (U.S. Patent No. 12265987). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12265987

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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