The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Jun. 14, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Erik Smith, Douglas, MA (US);

David Black, Acton, MA (US);

Boris Glimcher, Brooklyn, NY (US);

Vinay Rao, Bangalore, IN;

Assignee:

DELL PRODUCTS L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 3/0604 (2013.01);
Abstract

Embodiments of using command tags are described to prevent data corruption in a multi-path network in an NVMe over Fabrics (NVMe-OF) environment. A command tag is incorporated in a written command send from a host for command identification. Once the host detects an issue of a first link between the host and namespace, the host may immediately send, using a second link, a retry of a command that was previously sent by the host to a first controller via the first link. The retry of the command comprises the same command tag which allows the first and second controllers to detect an execution condition of the first write command, and thus avoiding repeat execution of the first write command by the first controller and the second controller. Therefore, data corruption may be addressed efficiently to the root cause.


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