The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Mar. 06, 2023
Applicant:

Bugcrowd Inc., San Francisco, CA (US);

Inventor:

Michael Skelton, Pimpama, AU;

Assignee:

BUGCROWD INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/338 (2019.01); G06F 11/36 (2006.01); G06F 11/3604 (2025.01); G06F 11/3668 (2025.01); G06F 16/215 (2019.01); G06F 40/194 (2020.01); G06F 40/20 (2020.01);
U.S. Cl.
CPC ...
G06F 16/338 (2019.01); G06F 11/3604 (2013.01); G06F 11/3692 (2013.01); G06F 16/215 (2019.01); G06F 40/194 (2020.01); G06F 40/20 (2020.01);
Abstract

A system allows users to submit information describing system defects, for example, defects in software systems. The system stores information describing defects for multiple external systems. The system further allows users to specify de-duplication rules for determining duplicate defects submitted by users. A de-duplication rule is associated with an original system defect and specifies regular expressions that are evaluated against a target system defect. The evaluation of the regular expressions against the target system defect indicates whether the target system defect is a duplicate of the original system defect. If the target system defect is determined to be a duplicate of another existing system defect, the target system defect may be closed.


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