The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Sep. 14, 2020
Nanjing Institute of Astronomical Optics & Technology, National Astronomical Observatories, Cas, Jiangsu, CN;
Yi Zheng, Jiangsu, CN;
ying Li, Jiangsu, CN;
Zhaoxiang Wu, Jiangsu, CN;
Bin Liang, Jiangsu, CN;
Lifeng Tang, Jiangsu, CN;
Abstract
The invention discloses a method for correcting the pointing errors of a biaxial rotation system based on the spherical cap function, comprising: error collection: selecting stars or radio sources distributed evenly in a star catalogue for tracking and observation to obtain the theoretical position and measurement position of the stars, and subtracting the measurement positions and the theoretical positions to obtain the error distribution; error model fitting: selecting a suitable orthogonal spherical cap function for the obtained error distribution and performing fitting to calculate an error fitting coefficient, the orthogonal spherical cap function model comprising a hemispheric harmonic function HSH, a Zernike spherical cap function ZSF, and a longitudinal spherical cap function LSF; and error control and compensation: putting the error model and the related fitting coefficient into a pointing control system for compensation. In the present method for correcting the pointing errors of a biaxial rotation system based on a spherical cap function, the model has strong stability and is not easily affected by measurement noise; there is no need to determine the form of the model on the bases of the frame form of the telescope, and the correction accuracy is high.