The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Sep. 12, 2018
Applicant:

Ii-vi Delaware, Inc., Wilmington, DE (US);

Inventors:

Li Wu, Fujian, CN;

Zhe Liu, Fujian, CN;

Guanglong Yu, Fujian, CN;

Yu Li, Fujian, CN;

Yan Su, Fujian, CN;

Zhiqiang Lin, Fujian, CN;

Assignee:

II-VI DELAWARE, INC., Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/08 (2006.01); G02B 1/10 (2015.01);
U.S. Cl.
CPC ...
G02B 5/0875 (2013.01); G02B 1/10 (2013.01); G02B 5/0883 (2013.01);
Abstract

Provided is a wide angle application high reflective mirror having a reflection band partially overlapping in a wavelength range of 800-4000 nm. The mirror comprises a film system in which a plurality of high refractive index film layers and a plurality of low refractive index film layers that are alternately stacked, and the material of the high refractive index film layer is one of SiH, SiOH, or SiON, or a mixture thereof. The highly reflective mirror can achieve a reflectance greater than 99% with an incident angle ranging from 0 to 60 degrees over a large angle range.


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