The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Feb. 28, 2020
The Mitre Corporation, McLean, VA (US);
John David Quartararo, Tyngsboro, MA (US);
Steven E. Langel, Ashland, MA (US);
The MITRE Corporation, McLean, VA (US);
Abstract
Systems and methods for detecting faults in estimator data are provided. In one or more examples, measurements from one or more data sources is received. The received data is used to calculate an innovation which in one or more examples can represent the difference between the received data and an expected value of the data. The innovation can then be used to generate a test statistic which is then accumulated at a plurality of monitors, wherein each monitor of the plurality of monitors is configured to accumulate the test statistic over varying periods of time. The accumulated test statistic at each monitor can be compared against a predefined threshold that is set for each individual monitor. If the accumulated test statistic at any particular monitor is found to be above its corresponding predefined threshold, then the system can alert the user that the received data is likely to be faulty.