The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Aug. 03, 2021
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Yuichiro Yamaji, Tokyo, JP;

Osamu Harakawa, Binan, PH;

Makoto Kameno, Binan, PH;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/09 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/093 (2013.01); G01R 33/0052 (2013.01); G01R 33/091 (2013.01);
Abstract

A magnetic sensor includes a sensor chip mounted on a substrate such that an element formation surface thereof is perpendicular to the substrate and a magnetism collecting member mounted on the substrate such that a surface thereof faces the substrate and a surface thereof faces the element formation surface. The arithmetic mean waviness Wa of the surface of the magnetism collecting member is 0.1 μm or less. When the arithmetic mean waviness Wa of the surface of the magnetism collecting member that faces the element formation surface is set to 0.1 μm or less, it is possible to significantly suppress a deterioration in detection sensitivity due to the presence of a gap between the element formation surface and the magnetism collecting member and to significantly reduce variations in detection sensitivity among products.


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