The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Nov. 04, 2020
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Go Itami, Tokyo, JP;

Hiroshi Hamada, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 29/08 (2006.01); G01S 17/08 (2006.01); H01Q 1/22 (2006.01); H01Q 1/50 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 29/0871 (2013.01); G01S 17/08 (2013.01); H01Q 1/2283 (2013.01); H01Q 1/50 (2013.01);
Abstract

A radio frequency antenna measurement system () of the present invention includes a receiving antenna () that receives a radiated radio wave from an on-chip radio frequency antenna (AUT). The receiving antenna () includes a waveguide (A) in which a connector (B) for outputting a reception signal to the power sensor () is integrally formed at a rear end. Accordingly, in a state where a microscope (MS) necessary for position adjustment of a feed probe () is installed, it is possible to construct a reception system that receives the radiated radio wave from the AUT and measures a radiation characteristic on a stage (), and to measure the radiation characteristic such as a gain and radiation pattern of the AUT with high accuracy.


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