The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Apr. 12, 2023
Applicant:

Christos Tsironis, St-Laurent, CA;

Inventor:

Christos Tsironis, Kirkland, CA;

Assignee:

Christos Tsironis, St-Laurent, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 27/00 (2006.01); G01R 27/04 (2006.01); G01R 31/28 (2006.01); G01R 35/00 (2006.01); H01P 3/02 (2006.01); H01P 5/08 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07378 (2013.01); G01R 1/06755 (2013.01); H01P 3/023 (2013.01); H01P 5/08 (2013.01);
Abstract

A waveguide to wafer-probe adapter includes an integrated computer-controlled load pull tuner forming a compact and handy assembly. The adapter includes a horizontal, a vertical and a sloped straight section, joined with two knee junctions. The tuner is simple and includes two, only along the sloped waveguide section moving at fixed penetration tuning probes without cumbersome vertical axis mechanisms. The sloped cavity section of the waveguide includes niches at the knee junctions, in which the probes can be moved and hidden, thus allowing a for low residual reflection and original transmission behavior. When the probes are hidden the adapter can be used for instantaneous s-parameter measurement still maintaining full load pull capacity. High-speed calibration and tuning algorithms allow efficient operation.


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