The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Jun. 21, 2021
Raytheon Technologies Corporation, Farmington, CT (US);
Jerry Ding, Brookfield, WI (US);
Greg C. Ojard, Vernon, CT (US);
Amit Surana, Newington, CT (US);
Ozgur Erdinc, Mansfield, CT (US);
RTX Corporation, Farmington, CT (US);
Abstract
A system comprising a computer readable storage device readable by the system, tangibly embodying a program having a set of instructions executable by the system to perform the following steps for indication confirmation for detecting a sub-surface defect, the set of instructions comprising: an instruction to initialize a transducer starting location and a transducer orientation responsive to a prior determination of a potential flaw location; an instruction to optimize an observation point of the transducer responsive to the transducer starting location and the transducer orientation responsive to a flaw response model; an instruction to move the transducer to the observation point location and orientation; an instruction to collect the scan data at the observation point location and orientation; and an instruction to analyze the scan data to extract a measure of the flaw response model; and an instruction to update the flaw response model.