The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Dec. 09, 2021
Tiama, Saint-Genis-Laval, FR;
Lubin Fayolle, Brignais, FR;
Julien Fouilloux, Lyons, FR;
TIAMIA, Saint-Genis-Laval, FR;
Abstract
A method for detecting, on the finish of containers, defects in a horizontal mold seal of the container includes the steps of disposing the container between a light source and a camera and ensuring the rotation of the container on itself according to one rotational revolution. The camera acquires, at each increment of rotation of the container, an image so that the number of images per rotational revolution is greater than 36. The images captured for each container are analyzed such that the profile of the finish edge is detected in each image, the profiles of the finish edge of the images are compared with a reference profile of the finish edge so as to detect deviations between these profiles, and a defect in the horizontal mold seal for a container is detected when at least one image of said container has a deviation.