The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Apr. 13, 2021
Horiba Advanced Techno, Co., Ltd., Kyoto, JP;
Issei Kobayashi, Kyoto, JP;
Keigo Sakamoto, Kyoto, JP;
Kohei Hara, Kyoto, JP;
Kimihiko Arimoto, Kyoto, JP;
HORIBA ADVANCED TECHNO, CO., LTD., Kyoto, JP;
Abstract
To accurately measure chromaticity and turbidity while achieving downsizing and employing a turbidity measurement method based on water quality standards of each country, an optical measurement includes a cell that accommodates a liquid sample, a transmitted light measurement light source that irradiates the liquid sample in the cell with light for transmittance, a scattered light measurement light source that irradiates the liquid sample in the cell with light for scattering, a photodetector that detects light from both sources, and a reflection mirror that reflects the light for transmittance in the cell to cause the light for transmittance to be directed to the photodetector. The scattered light measurement light source emits the light for scattering toward a post-reflection optical path of the light for transmittance reflected by the reflection mirror and directed to the photodetector so that the light for scattering intersects the post-reflection optical path at a predetermined angle.