The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Nov. 13, 2020
Applicant:

University of Tsukuba, Tsukuba, JP;

Inventors:

Yoshiaki Yasuno, Tsukuba, JP;

Daisuke Oida, Tsukuba, JP;

Kensuke Oikawa, Tsukuba, JP;

Assignee:

University of Tsukuba, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01B 9/02091 (2022.01);
U.S. Cl.
CPC ...
G01N 21/455 (2013.01); G01B 9/02091 (2013.01);
Abstract

A phase gradient calculation unit calculates a phase gradient on a plane intersecting an irradiation direction of light corresponding to an optical coherence tomography signal indicating a state of a sample for each of sample points arranged on the plane. A bulk phase error calculation unit integrates, for each of plurality of paths from an origin that is a sample point where a bulk phase error is determined to a destination that is a sample point where the bulk phase error is not determined, the phase gradient for each of the sample points along each of the plurality of corresponding paths to calculate a path specific phase error at the destination, and combines the path specific phase errors among the plurality of corresponding paths to determine the bulk phase error at the destination.


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