The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Aug. 16, 2019
Applicant:
Essenlix Corporation, Monmouth Junction, NJ (US);
Inventors:
Stephen Y. Chou, Princeton, NJ (US);
Wei Ding, Princeton, NJ (US);
Ji Qi, Hillsborough, NJ (US);
Jun Tian, Belle Mead, NJ (US);
Assignee:
Essenlix Corporation, Monmouth Junction, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/01 (2006.01); G02B 21/00 (2006.01); G02B 21/06 (2006.01); G02B 21/18 (2006.01); H04N 23/56 (2023.01); H04N 23/57 (2023.01); H04M 1/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 21/01 (2013.01); G02B 21/0008 (2013.01); G02B 21/06 (2013.01); G02B 21/18 (2013.01); H04N 23/56 (2023.01); H04N 23/57 (2023.01); G01N 2201/02 (2013.01); G01N 2201/061 (2013.01); G01N 2201/062 (2013.01); G01N 2201/0635 (2013.01); G01N 2201/08 (2013.01); H04M 1/0264 (2013.01);
Abstract
Disclosed is an optical system for interrogating a sample, an optical system for measuring the spectrum of a beam of light, an optical system for measuring the spectrum of two beams of light, a compact imaging-based sensor or sensors, and combinations thereof.