The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Dec. 17, 2020
Applicant:

Rion Co., Ltd., Kokubunji, JP;

Inventors:

Kaoru Kondo, Kokubunji, JP;

Kazuna Bando, Kokubunji, JP;

Takuya Tabuchi, Kokubunji, JP;

Sota Kondo, Kokubunji, JP;

Assignee:

RION CO., LTD., Kokubunji, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/0227 (2024.01); G01N 21/05 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0227 (2013.01); G01N 21/05 (2013.01); G01N 2021/0112 (2013.01); G01N 2021/052 (2013.01);
Abstract

Provided is a particle measurement device in which irradiation light emitted by a light source is expanded by an expander in a shape satisfying the requirements of a diffractive optical element, converted into parallel light, and made to enter the diffractive optical element. The diffractive optical element shapes the irradiation light entering therein into a flat top beam in which the cross section in the focal position thereof has an elongate rectangle shape. The intensity distribution of light can be made substantially uniform in a detection area formed by the shaped irradiation light.


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