The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2025

Filed:

Nov. 02, 2020
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Scott Alan Gold, Waynesville, OH (US);

John Poland, Cincinnati, OH (US);

Assignee:

General Electric Company, Evendale, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/165 (2017.01); B29C 64/268 (2017.01); B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01); B33Y 30/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/165 (2017.08); B29C 64/268 (2017.08); B29C 64/393 (2017.08); B33Y 50/02 (2014.12); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12);
Abstract

Systems and methods for optical based monitoring of additive manufacturing processes are provided. In one example a method includes obtaining optical data representing a layer of a structure being manufactured using an additive manufacturing process, comparing the optical data with a standard optical representation associated with the structure, determining one or more nonconformance conditions between the optical data representing the layer and the standard optical representation, and implementing a control action based at least in part on the one or more nonconformance conditions.


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