The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Nov. 12, 2019
Renishaw Plc, Wotton-under-Edge, GB;
Kiera Megan Jones, Stroud, GB;
Paul Martin Scully, Stroud, GB;
RENISHAW PLC, Wotton-under-Edge, GB;
Abstract
A computer implemented method including receiving first sensor data from a first sensor monitoring an additive manufacturing process, the first sensor data including a plurality of first sensor values; receiving second sensor data from a second sensor monitoring the additive manufacturing process, the second sensor data including a plurality of second sensor values. Each first sensor value and each second sensor value is associated with a corresponding time during the additive manufacturing process at which the sensor value was generated. Analysing the first and second sensor data to identify a first and second anomalous event that occurred in the additive manufacturing process and a corresponding first and second anomalous event time. Identifying whether the first anomalous event is a potential cause of second anomalous event based upon the anomalous event times. Generating an output based upon identification that the first anomalous event is a potential cause of second anomalous event.