The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Jun. 12, 2020
Trustees of Tufts College, Medford, MA (US);
Sergio Fantini, Winchester, MA (US);
Angelo Sassaroli, Arlington, MA (US);
Giles Blaney, Somerville, MA (US);
Trustees of Tufts College, Medford, MA (US);
Abstract
An apparatus for earning out near-infrared spectroscopy using intensity-modulated near-infrared radiation or pulsed near-infrared radiation includes sources and detectors. For each source, there exists first and second distances. The first distance is a distance between the source and a first detector. The second distance is a distance between the source and the second detector. For each source, the difference between these two distances is the same. Additionally, wherein, for each source, the detector at a shorter distance is the same detector that is at a longer distance for the other source. A processor derives, from signals received by the detectors, a parameter indicative of two matched slopes. Tins parameter is either phase of the intensity-modulated near-infrared radiation or mean time-of-flight data for the pulsed near-infrared radiation. The processor then provides output data based on an average of the matched slopes. This promotes reduced sensitivity to superficial layers and enhanced sensitivity to deeper portions of a medium that is under investigation.