The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Aug. 09, 2024
Bruker Switzerland Ag, Faellanden, CH;
Dimitris Papanastasiou, Faellanden, CH;
Oliver Raether, Faellanden, CH;
Niels Goedecke, Faellanden, CH;
BRUKER SWITZERLAND AG, Faellanden, CH;
Abstract
An ion analysis apparatus includes an ionization source that generates a beam of ions and a trapping device that axially transfers the ions downstream. A first quadrupole mass filter receives the ions from the trapping device and transfers at least a first subset of the received ions. A segmented linear quadrupole ion trap performs a first processing step on the at least first subset of ions and transfers the processed ions. A second quadrupole mass filter receives the processed ions transferred from the segmented linear quadrupole ion trap and transfers at least a second subset of the processed ions. A collision cell receives and performs a second processing step on the at least second subset of processed ions. A mass analyzer performs mass analysis of the ions processed by the collision cell.