The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Jun. 02, 2020
Applicant:
Illumina, Inc., San Diego, CA (US);
Inventors:
Sarah L. Kinnings, San Diego, CA (US);
Cosmin Deciu, San Diego, CA (US);
Badri Padhukasahasram, San Jose, CA (US);
Dimitri Skvortsov, Orinda, CA (US);
Assignee:
Illumina, Inc., San Diego, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16B 20/10 (2019.01); G16B 30/00 (2019.01); G16B 30/20 (2019.01); G16B 40/20 (2019.01); G16B 40/30 (2019.01);
U.S. Cl.
CPC ...
G16B 20/10 (2019.02); G16B 30/00 (2019.02); G16B 30/20 (2019.02); G16B 40/20 (2019.02); G16B 40/30 (2019.02);
Abstract
Provided are methods and systems for sample quality control in CNV detection using test samples comprising cell-free nucleic acid fragments originating from a mother and a fetus. The method involves determining an exclusion region defined by at least a fetal fraction limit of detection (LOD) curve. The fetal fraction LOD curve varies with coverage values and indicates minimum values of fetal fractions needed to achieve a detection criterion given different coverages.