The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Nov. 07, 2019
Applicant:
Natera, Inc., San Carlos, CA (US);
Inventors:
Styrmir Sigurjonsson, San Jose, CA (US);
Naresh Vankayalapati, San Francisco, CA (US);
Allison Ryan, Belmont, CA (US);
Zachary Demko, San Francisco, CA (US);
Milena Banjevic, Los Altos Hills, CA (US);
Assignee:
Natera, Inc., San Carlos, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G16B 5/00 (2019.01); G16B 5/20 (2019.01); G16B 20/00 (2019.01); G16B 20/10 (2019.01); G16B 30/00 (2019.01); G16H 10/40 (2018.01);
U.S. Cl.
CPC ...
G16B 20/10 (2019.02); G16B 5/00 (2019.02); G16B 5/20 (2019.02); G16B 20/00 (2019.02); G16B 30/00 (2019.02); G16H 10/40 (2018.01);
Abstract
Provided herein are improved methods for detecting aneuploidy in a sample. The methods in certain embodiments are used for the analysis of circulating DNA in serum samples, such as circulating fetal DNA or circulating tumor DNA. In certain embodiments, chromosome or chromosome segments of interest are used to set a bias model and/or a control value for a z-score determination, in illustrative examples without the use of a control chromosome.