The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Mar. 10, 2022
Applicant:
Cimpress Schweiz Gmbh, Winterthur, CH;
Inventors:
Anshul Garg, Bangalore, IN;
Ajay Joshi, Bedford, MA (US);
Assignee:
CIMPRESS SCHWEIZ GMBH, Winterthur, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/10 (2017.01); G06T 7/13 (2017.01); G06V 10/60 (2022.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06T 7/10 (2017.01); G06T 7/13 (2017.01); G06V 10/60 (2022.01); G06T 2207/20021 (2013.01); G06T 2207/20132 (2013.01); G06T 2207/30204 (2013.01);
Abstract
Systems and methods for detecting crop marks depicted in digital images are disclosed. According to certain aspects, an electronic device detects a set of crop marks in a reference digital image and aligns the reference digital image with an input digital image. Based on locations of the detected crop marks as aligned to the input digital image, the electronic device detects a set of partial crop marks in the input digital image. As a result, the partial crop marks in the input digital image may be removed.