The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Mar. 04, 2022
Applicant:
Ethicon, Inc., Somerville, NJ (US);
Inventor:
Deepika Sinha, Somerville, NJ (US);
Assignee:
Ethicon, Inc., Raritan, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 5/70 (2024.01); G06T 7/00 (2017.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 5/70 (2024.01); G06T 7/70 (2017.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06T 2207/30024 (2013.01);
Abstract
An image of a zone of inhibition (ZOI) plate is received. The image is processed to detect sutures within the image of the ZOI plate using computer vision, detect a contour of a ZOI within the image of the ZOI plate using computer vision, generate an overlay based on smoothening the contour of the ZOI and perform one or measurements on the image of the ZOI plate, wherein each of the one or more measurements comprises a distance between the sutures and the overlay.