The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Aug. 29, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Guo-Chin Sun, New Taipei, TW;
Chin-Pin Kuo, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method for detecting a product for defects implemented in an electronic device includes detecting images of a product for defects by a first defect detection model in a preset period, and obtaining a detection result; when a ratio of the number of negative sample images is greater than a preset threshold, training an autoencoder model; obtaining historical positive sample images of the product, inputting the history positive sample images into the trained autoencoder model, and calculating a latent feature; inputting the latent feature of each history positive sample image into a decoding layer of the trained autoencoder model, and calculating newly added positive sample images; training the first defect detection model and obtain a second defect detection model; and inputting images of a product to be detected to the second defect detection model, and obtaining a detection result of the product.