The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Jun. 19, 2020
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Kai Walter, Schriesheim, DE;
Benjamin Deissler, Butzbach, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/10 (2006.01); G02B 7/38 (2021.01); G02B 21/12 (2006.01); G02B 21/24 (2006.01); G06F 17/13 (2006.01); G06F 17/15 (2006.01); G06T 5/20 (2006.01); G06T 5/70 (2024.01); G06T 5/73 (2024.01); G06T 7/00 (2017.01); G06V 10/30 (2022.01); H04L 25/02 (2006.01); H04N 25/615 (2023.01);
U.S. Cl.
CPC ...
G06T 5/73 (2024.01); G02B 7/38 (2013.01); G02B 21/12 (2013.01); G02B 21/244 (2013.01); G06F 17/13 (2013.01); G06F 17/15 (2013.01); G06T 5/10 (2013.01); G06T 5/20 (2013.01); G06T 5/70 (2024.01); G06T 7/0012 (2013.01); G06V 10/30 (2022.01); H04L 25/025 (2013.01); H04N 25/615 (2023.01); G06T 2207/10056 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20182 (2013.01); G06T 2207/30024 (2013.01);
Abstract
An apparatus for enhancing an input phase distribution (I(x)) is configured to retrieve the input phase distribution (I(x)) and compute a baseline estimate (ƒ(x)) as an estimate of a baseline (I(x)) in the input phase distribution (I(x)). The apparatus is further configured to obtain an output phase distribution (O(x)) based on the baseline estimate (ƒ(x)) and the input phase distribution (I(x)).