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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12260517 B1

PDFFull Text
Date of Patent:
Mar. 25, 2025

Filed:

Dec. 07, 2021

Optical system and optical image processing method using image restoration

Applicant:

National Central University, Taoyuan, TW;

Inventors:

Chen Han Huang, Taoyuan, TW;

Chun San Tai, Taoyuan, TW;

Ting Yi Lin, Taoyuan, TW;

Assignee:

NATIONAL CENTRAL UNIVERSITY, Taoyuan, TW;

Attorney:
Primary Examiner:

John Villecco

Assistant Examiner:

Alejandro undefined Hernandez

Int. Cl.
CPC ...
G06T 5/00 (2024.01); G01R 33/56 (2006.01); G06T 3/40 (2024.01); G06T 5/50 (2006.01); G06V 10/40 (2022.01); G06V 10/80 (2022.01); G06V 10/82 (2022.01); G06V 20/69 (2022.01); G16H 10/40 (2018.01); G16H 30/40 (2018.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G06T 5/00 (2013.01); G01R 33/56 (2013.01); G06T 3/40 (2013.01); G06T 5/50 (2013.01); G06V 10/40 (2022.01); G06V 10/806 (2022.01); G06V 10/82 (2022.01); G06V 20/693 (2022.01); G06V 20/695 (2022.01); G16H 10/40 (2018.01); G16H 30/40 (2018.01); H04N 23/56 (2023.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30024 (2013.01); G06V 2201/03 (2022.01);
Abstract

Disclosed is an optical system using image restoration, including a light source, a pinhole, a testing platform, an image sensor and an image processing device. The pinhole is disposed on a light transmission path of the light source. The testing platform is disposed on the light transmission path of the light source and the pinhole is located between the light source and the testing platform. The testing platform is used to place a testing sample. The image sensor is disposed below the testing platform, and used to sense the testing sample so as to output an optical diffraction signal. The image processing device is electrically connected to the image sensor and used to perform signal processing and optical signal recognition on the optical diffraction signal of the testing sample so as to obtain a clear image of the testing sample.

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