The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Mar. 23, 2022
Micro Focus Llc, Santa Clara, CA (US);
Alexander Hoole, Santa Clara, CA (US);
Ali ElKortobi, Spring Branch, TX (US);
Reiner Kappenberger, Groveland, CA (US);
Domingo Juan Rivera, Holly Springs, NC (US);
Micro Focus LLC, Santa Clara, CA (US);
Abstract
Testing software applications often requires a balancing of thoroughness versus the time and computing resources available to perform such tests. Certain data handling operations may potentially expose data to unauthorized parties. However, not all data is equal; some data requires a greater degree of protection than other data, which may be based on a security context (e.g., rule, law, policy, etc.). By generating rules determined by a particular context, extraneous tests on data outside of the context, may be omitted. Unnecessary tests may be omitted and the results of each analysis process correlated to identify actual vulnerabilities and omit false positives, such as vulnerabilities to data that does not require the same degree of care to avoid unauthorized exposure.