The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Dec. 14, 2022
Applicant:

Scale Ai, Inc., San Francisco, CA (US);

Inventors:

Jihan Yin, San Francisco, CA (US);

Chiao-Lun Cheng, Taipei, TW;

Assignee:

Scale AI, Inc., San Francisco, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2246 (2019.01);
Abstract

One embodiment of the present invention sets forth a technique for sampling from a dataset. The technique includes determining a plurality of embeddings for a plurality of data points included in the dataset. The technique also includes populating a tree structure with the plurality of embeddings by generating a first node that stores a first set of embeddings included in the plurality of embeddings and generating a first plurality of nodes as children of the first node, where each node in the first plurality of nodes stores a different subset of embeddings in the first set of embeddings. The technique further includes sampling a subset of embeddings from the plurality of embeddings via a traversal of the tree structure, and generating a sampled dataset that includes a subset of data points corresponding to the subset of embeddings.


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