The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Nov. 10, 2021
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Milosh Stolikj, Eindhoven, NL;

Qi Gao, Eindhoven, NL;

Bart Albertus Gerardus Van Der Velden, Eindhoven, NL;

Jurgen Jan Rusch, Eindhoven, NL;

Eugene Alekseyevich Ivanov, Eindhoven, NL;

Mauro Barbieri, Eindhoven, NL;

Johannes Henricus Maria Korst, Eindhoven, NL;

Marc André Peters, Veldhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/32 (2006.01); G06F 11/22 (2006.01); G16H 40/40 (2018.01);
U.S. Cl.
CPC ...
G06F 11/321 (2013.01); G06F 11/2268 (2013.01); G16H 40/40 (2018.01);
Abstract

A method () of automated identification of one or more malfunction areas of a set (S) of malfunction areas for a service case in which a medical device () is serviced includes: generating an output probability vector () of probabilities for the set of malfunction areas of the medical device by operations including applying at least one classifier () to at least one of () text descriptions of parts ordered for the service case and/or () a text description of the service case; and displaying a list () of one or more most probable malfunction areas for the service case wherein the one or more most probable malfunction areas are the one or more most malfunction areas of the set of malfunction areas having highest probability in the output probability vector.


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