The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Jul. 29, 2021
Nutanix, Inc., San Jose, CA (US);
Angshuman Bezbaruah, Redmond, WA (US);
Kiran Tatiparthi, Dublin, CA (US);
Mahesh Venkataramaiah, San Jose, CA (US);
Pranay Kumar Ega, Gilroy, CA (US);
Praveen Kumar Padia, Fremont, CA (US);
Ramya Bolla, San Jose, CA (US);
Sudhir Ravi, San Jose, CA (US);
Nutanix, Inc., San Jose, CA (US);
Abstract
A high frequency snapshot technique improves data replication in a disaster recovery (DR) environment. A base snapshot is generated from failover data at a primary site and replicated to a placeholder file at a secondary site. Upon commencement of the base snapshot generation and replication, incremental light weight snapshots (LWSs) of the failover data are captured and replicated to the secondary site. A staging file at the secondary site accumulates the replicated LWSs ('high-frequency snapshots'). The staging file is populated with the LWSs in parallel with the replication of the base snapshot at the placeholder file. At a subsequent predetermined time interval, the accumulated LWSs are synthesized to capture a “checkpoint” snapshot by applying and pruning the accumulated LWSs at the staging file. Once the base snapshot is fully replicated, the pruned LWSs are merged to the base snapshot to synchronize the replicated failover data.