The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Sep. 29, 2021
Applicant:

The Government of the United States of America, As Represented BY the Secretary of the Navy, Arlington, VA (US);

Inventors:

Jesse Frantz, Washington, DC (US);

Jason Myers, Alexandria, VA (US);

Vinh Q. Nguyen, Fairfax, VA (US);

Jasbinder Sanghera, Ashburn, VA (US);

Robel Bekele, Washington, DC (US);

Anthony Romano Clabeau, Alexandria, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/01 (2006.01); G02B 1/10 (2015.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
G02F 1/0147 (2013.01); G02B 1/10 (2013.01); H01L 21/02568 (2013.01); G02F 2202/30 (2013.01);
Abstract

Tunable devices and methods for fine tuning the optical responses of thin film devices post fabrication are described. This approach modifies the refractive indices of the chalcogenide glass thin films incorporated into the devices, and using this change in the refractive indices to fine tune the optical responses of the devices. Thermal annealing may be used to modify the refractive index. Thermal annealing provides good uniformity in large-area devices and may be applied to multi-layer structures.


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