The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Feb. 18, 2022
Duke University, Durham, NC (US);
DUKE UNIVERSITY, Durham, NC (US);
Abstract
A microscopy system includes a primary lens and a planar array of micro-cameras. Each micro-camera of the planar array of micro-cameras has a field of view at an intermediate plane that overlaps at least one other micro-camera's field of view at the intermediate plane in a direction. The primary lens is disposed in a light path between the array of micro-cameras and a target area. In some cases, an overlap amount in the direction of the field of view at the intermediate plane for each micro-camera is at least 50%. A method of microscopy imaging includes directing light to a target area and simultaneously capturing a first set of images of the target area while the light illuminates the target area via a planar array of micro-cameras having a field of view at an intermediate plane disposed between a primary lens and the planar array of micro-cameras.