The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Mar. 03, 2023
Carl Zeiss Meditec Ag, Jena, DE;
Christian Voigt, Abtsgmünd, DE;
Markus Philipp, Aalen, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A method for operating a microscopy system and to a microscopy system are provided. A pivot point is defined, wherein the microscopy system is operated such that a microscope of the microscopy system moves at a constant distance around the pivot point, wherein a reference surface is determined, wherein an intersection of an optical axis of the microscope and the reference surface is determined as the pivot point, wherein the pose of the reference surface is defined in a focal position-independent reference coordinate system and the pivot point is determined as the intersection of the optical axis with the thus defined reference surface in the reference coordinate system.