The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
Nov. 15, 2019
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
Hidemi Tsuchida, Tsukuba, JP;
Abstract
An optical measurement device and an optical measurement method that can accurately measure a distance and a velocity by removing an influence of a nonlinear chirp of a laser in FMCW LiDAR. The optical measurement device includes a laser that outputs light of which a frequency is modulated; a photodetector; a heterodyne optical system that splits output light of the laser into two components, uses one as probe light, uses the other as reference light, adds a frequency shift to one of the probe light and the reference light, applies the probe light to an object, combines scattered light from the object and the reference light, and causes the combined light to be incident on the photodetector; an IQ detector; and an arithmetic operation processor.