The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Nov. 27, 2019
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventor:

Kumiko Mahara, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/18 (2020.01); G01S 7/48 (2006.01); G01S 7/484 (2006.01); G01S 7/4865 (2020.01); G01S 17/89 (2020.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 17/18 (2020.01); G01S 7/4806 (2013.01); G01S 7/484 (2013.01); G01S 7/4865 (2013.01); G01S 17/89 (2013.01); G01S 17/931 (2020.01);
Abstract

A measurement apparatus includes a light reception section including a light reception element group including light reception elements in a target region, a controller that controls a first light reception element group and a second light reception element group in the light reception element group, so as to read out the first light reception element group and the second light reception element group during periods different from each other, and a signal processing section that performs signal processing on the basis of a signal read out from at least one of the first light reception element group and the second light reception element group. A sum set of the first light reception element group and the second light reception element group includes the light reception elements, and at least part of the first light reception element group is not included in the second light reception element group.


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